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Laser Diode Reliability, Burn-In and Life-Test System

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產(chǎn)品名稱: Laser Diode Reliability, Burn-In and Life-Test System
產(chǎn)品型號: 58602
產(chǎn)品展商: Chroma
產(chǎn)品文檔: 無相關(guān)文檔

簡單介紹

Burn-In, Reliability and Life Testing Up to 4608 Channels Up to 20A per device Up to 150 oC Batch processing via device carriers Change Kit – adapts to multiple devices


Laser Diode Reliability, Burn-In and Life-Test System  的詳細介紹
產(chǎn)品特色
  • Burn-In, Reliability and Life Testing
  • Up to 4608 Channels
  • Up to 20A per device
  • Up to 150 oC
  • Batch processing via device carriers
  • Change Kit – adapts to multiple devices
 Burn-in, Reliability & Life Test
Chroma 58602 is a high density, precision multi Source Measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-In, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, Silicon Photonics, photo-diodes and other similar components. Each module has up to 768 discrete SMUs (6 modules contain up to 4608 SMUs per system), which may be used as Device Drives, Device Biasing and/or Measurement Operations. The system's high density allows for optimized clean room space.
 Source and Measurement
Discrete voltage measurements are available for high current devices placed in series. Multiple current sources may also be paralleled (exchanging the conversion interface board) to support higher power devices.
 Ultimate Flexibility
Chroma brings the change kit fiexibility used in the semiconductor industry to optoelectronics. Through the change kit the 58602 can be configured to other devices in minutes for:
  • High Channel Density
  • Higher Currents
  • Monitor Photodiode Measurements
  • Dark Current Measurements
  • Component Biasing
  • Multiple Device Types
 Efficient Processing
  • Higher temperatures reduce aging times and provide quicker results while lowering cost by requiring lower channels
  • The High Density Design reduces floor space over other similar solutions
  • Batch processing is performed through device carriers. Carriers may be used between Aging and Characterization Testing. Software tracks acquired data between all Chroma testing
  • Same base system may be used for many device types. A Conversion Kit provides quick, cost effective adaptation to prototypes and new products or variation in production
  • Hot Swappable power supplies eliminate this type of failure mode while reducing MTBF / MTTR
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